Used HITACHI S-8820 #9180041 for sale

Name: HITACHI S-8820
Brand: HITACHI
SKU: 9180041
Availability: SoldOut

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Scanning Electron Microscopes

Manufacturer

HITACHI

Model

S-8820

ID: 9180041

Vintage: 1996

CD Scanning electron microscope (SEM) System configuration: Main body C to C unit Display unit Power supply unit Transformer Operation console (2) Dry pumps Vaccum level for electron gun chamber: IP-1: 1.0 x 10-7 Pa IP-2: 5.2 x 10-7 Pa IP-3: 4.2 x 10-5 Pa Electron beam parameter: If = 2.26(A) Vs = 0.50(KV) V1 = 1.70(KV) V2 = 3.80(KV) V0 = 1.60(KV) Ie = 50.8(uA) Workstation model: 715/64 Facility information: Air N2 Vacuum Power requirements: 1 Phase, 110 VAC 1996 vintage.

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HITACHI S-8820 scanning electron microscope is a powerful tool for observation, imaging, and analysis. It employs a secondary electron detector, backscattered electron detector, and two quadrant detector equipment for imaging and analysis. This instrument employs field-emission sources, vacuum chamber technology, and a low-voltage detection system that enable the realization of high-voltage electron microscopes. The electron optics of HITACHI S 8820 are designed in a double-objective configuration with a maximum accelerating voltage of 30KV, a minimum accelerating voltage of 0.5KV, and a maximum magnification of 40,000X. Its highly reliable imaging unit produces excellent images with high depth of focus and low spatial resolution, allowing users to evaluate the surfaces of samples. The illumination machine is designed to optimize imaging while minimizing background noise. S-8820 is equipped with a low-noise detector and imaging tool, allowing the acquisition of images with resolutions as low as 10nm, making it ideal for imaging delicate features. It incorporates features such as Data Entry Link, which allows the user to control all parameters from the PC and Automatic Gain Control (AGC) for extra flexibility. The asset has built-in software for advanced image processing. This software has various capabilities, including histogram analysis, 3D surface reconstruction, filtering, measurement, image annotation, and image segmentation. S 8820 also includes an automated stage for collecting multiple images of the same sample with a few simple commands. HITACHI S-8820 can be used for a variety of applications, including defect analysis, process monitoring, failure diagnosis, material characterization, strain analysis, and even lithography. The combination of high sensitivity and resolution make it suitable for high-end materials characterization. Furthermore, its additional functions such as data entry link and software integration make it perfect for advanced failure analysis and lithography.