Used HITACHI S-8820 #9266109 for sale

HITACHI S-8820 scanning electron microscope (SEM) is a state-of-the-art instrument designed for advanced electron microscopy research. It is used for sample observation and analysis of specimens in high resolution and spatial accuracy, with superior flexibility and broad operation range. HITACHI S 8820 SEM is suitable for a wide range of materials and applications, including microstructural imaging, nano-scale electron diffraction, electrical characterization, and a variety of other fields. S-8820 provides excellent contrast imaging capabilities due to its high-resolution field effect angle gun, which is capable of producing finely focused electron beams. The gun has an adjustable energy of up to 5kV and a small working distance of 10 nanometers between the sample surface and the electron optical column. Its athermal field emission tips allow for further adjustment of the beam profile to yield optimal image contrast and resolution. The specimen stage is accurate and stable, allowing for a well-defined sample chamber, even when viewing larger areas. S 8820 has built-in advanced automated functions to provide repeatable, reliable operation. Its automatic sample aligning and image stiching functions facilitate the acquisition of high resolution images of large area specimens quickly and easily. The microscope also has a powerful software suite to facilitate specimen orientation and data acquisition. In addition to its imaging capabilities, HITACHI S-8820 SEM is equipped with metal deposition, (C)LABS, EDS and EBSD detectors allowing for elemental and structural analysis of specimens. Its ultra-high vacuum capability and low drift electronics system enables reliable analyses even of fragile samples with sensitive surface features. The system also features an advanced collision avoidance technology, which prevents sample damage even when conducting high-resolution imaging or structural analyses. Overall, HITACHI S 8820 is an excellent scanning electron microscope for advanced research applications. Its combination of high resolution imaging capabilities, automated functions, EDS/EBSD analysis, metal deposition, (C)LABS, and collision avoidance technologies provide users with a powerful tool to investigate sample morphologies and structures with greater clarity and detail than ever before.