Used HITACHI S-8820 #9266234 for sale

HITACHI S-8820 Scanning Electron Microscope (SEM) is a high-end, benchtop model used in a variety of scientific research fields across the world. The microscope utilizes a field emission gun (FEG) combined with an advanced detection system to obtain high-resolution images of specimens at magnifications between 1,000 and 300,000X. SEMs such as HITACHI S 8820 provide a wealth of topographical and chemical analysis across the surface of specimens in a variety of fields ranging from medical science to materials science. The instrument's FEG is critically important to the accuracy and precision of the image. The FEG emits a narrow beam of electrons, with the diameter of the beam being inversely proportional to the voltage of the beam. The diameter of the electron beam also determines the resolution of the image; smaller beam diameters enable higher resolution images. S-8820's FEG operates at 3KV, 5KV, and 10KV and a 'High Vacuum' mode of 1KV, providing superior control over the electron beam. S 8820 Scanning Electron Microscope employs an advanced detection system for optimal image quality. A variety of detectors together capture the reflected electrons from the sample, volume or surface of the specimen, providing much more data than a traditional optical microscope. HITACHI S-8820 provides an SE signal detector, which measures the number of electron-reflected signals with high accuracy, as well as a BackScattered Electron Detector (BSD) for improved elemental and surface feature analysis, and a Secondary Electron Detector (SED) with continuously variable voltage for depth profile imaging. HITACHI S 8820 Scanning Electron Microscope contains a secondary electron imaging mode, providing a deep look at the makeup and structure of a specimen without the need for sample prep. This mode of operation allows for fast imaging of porous, fibrous and irregular specimens. Additionally, S-8820 has an environmental SEM (ESEM) mode, which can be used to image hydrated or soft materials without the need for surface preparation or the presence of a surface coating. This mode allows users to capture objects in their native condition, giving more accurate results. The flexibility and range of S 8820 allow it to be seamlessly integrated into any laboratory setting. The microscope's user-friendly design and automated functions give scientists the freedom to conduct their research in whatever way is most conducive to their project. The state-of-the-art tomography and 3D imaging capabilities allow for unparalleled structural and quality analysis. When paired with the high-powered resolution and easy user interface, HITACHI S-8820 gives scientists an invaluable tool for professional research.