Used HITACHI S-8820 #9389824 for sale

HITACHI S-8820
ID: 9389824
Scanning Electron Microscope (SEM).
HITACHI S-8820 Scanning Electron Microscope (SEM) is a high-resolution imaging and analysis equipment that provides powerful tools for high-accuracy and high-speed analysis of a variety of materials. With its high resolution and low operating voltage, HITACHI S 8820 is suited to perform analysis of both conventional and non-conductive specimens. Equipped with fast scanning, image storage, and large chamber size, S-8820 is a highly versatile system that can be used to perform a variety of tasks in a variety of applied fields. S 8820 utilizes a combination of a large chamber and a high electrostatic lens unit to achieve extremely high resolution imaging and analysis. The large chamber provides a wide field of view and the high resolution electrostatic lens machine ensures accurate magnifications and imaging of fine details. The high resolution capabilities of HITACHI S-8820 are provided by a scanning beam deflector, which allows the SEM to detect details that would be difficult to observe with conventional light microscopes. HITACHI S 8820 also features an automated sample feeder that can be used to quickly scan multiple specimens without the need for manual intervention. The feeder utilizes a low voltage auto-scanning tool that allows for rapid analyses of specimens. The specimen is loaded onto the sample feeder and the auto-scanning asset is activated. The model then begins scanning the specimen and the data is then processed and analyzed at an extremely fast rate. S-8820 also features an advanced analysis equipment that allows for sophisticated imaging and analysis of a variety of different materials. The system is capable of detecting and measuring characteristics such as surface topography, surface roughness, grain size, and other characteristics that are important in materials analysis. The unit also includes a sophisticated image processing toolkit, which allows for 3-dimensional reconstructions and measurements of surface features. Overall, S 8820 Scanning Electron Microscope is an ideal choice for high-accuracy and high-speed analysis of a variety of specimens. Its large chamber size, advanced automatic sample feeder, and high-resolution electrostatic lens machine make it an attractive option for advanced imaging and analysis tasks. Its advanced analysis capabilities, image processing toolkit, and fast scanning capabilities ensure that HITACHI S-8820 provides reliable data for a wide variety of applications.
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