Used HITACHI S-8820S #9265147 for sale

HITACHI S-8820S is a Scanning Electron Microscope (SEM) that combines superior high-definition performance with advanced digital imaging capabilities. The instrument uses electrons to create high-resolution images of the specimen surface. The images produced by the SEM can range from magnifications of 20,000x to 120,000x, providing a detailed view of the sample's surface down to the atomic level. HITACHI S-8820 S has a unique dual electron beam system that creates a more efficient imaging process. It has two electron guns that generate and control the beam's energy and position for more accurate sample imaging. The instrument also has an electron detector that captures the electrons scattered from the surface of the sample and converts them into a signal that is then used to generate an image of the sample. A multi-coincidence pole subsystem combined with a DC gun and an energy filter fine tune the transmitted beam and sample position for precise image control. S 8820 S has an array of digital imaging features that make it easy to capture and process images. Digital imaging techniques like secondary electron images (SEI), backscattered electron images (BSE), and cathodoluminescence (CL) images offer increased contrast and brightness, allowing for better identification of sample features and aiding in the quantification of sample components. S-8820 S also offers a range of user-friendly software that helps simplify operations and enhances data analysis capabilities. The intuitive software allows users to easily set up and store image acquisition parameters, optimize image quality, analyze electron microscopic data, and perform other operations. The software can also be used to allocate image files and to carry out dual-beam and electron optical operations. In addition, HITACHI S 8820 S features a built-in automated stage for scanning samples up to 6" (15 cm) in size. The stage offers five degrees of freedom, allowing for precise adjustment of the sample position. The automated stage has a large sample chamber, allowing for extended scanning without loss of detector function. S-8820S is an effective and advanced scanning electron microscope ideally suited for a range of scientific and educational applications. Thanks to its dual electron beam, digital imaging capabilities and intuitive software, research can be conducted with accuracy and ease.