Used HITACHI S-8840 #9077721 for sale

HITACHI S-8840 is a scanning electron microscopy (SEM) equipment operated with a high level of precision, allowing for a wide variety of applications. It is beneficial for inspecting the surface structure of a specimen, measuring nanometer-size features with great accuracy, and characterizing electrical and chemical properties of materials. HITACHI S8840 offers both high performance and quality imaging and analytical capabilities. This advanced system features an integrated high vacuum unit which enables high level vacuum operation. This allows for higher resolution imaging and improved analytical performance. Additionally, the low- and medium-vacuum modes enable non-destructive imaging of surface and non-conductive materials. S 8840 incorporates several types of detectors, including secondary and backscattered electron detectors, a high performance energy dispersive X-ray (EDX) detector, and a built-in high-sensitivity Faraday cup. Together, these detectors can detect a variety of electron and X-ray signals. The EDX detector is particularly powerful, enabling elemental analysis of the specimen at atomic resolution. The high performance Faraday cup allows accurate analysis of weak secondary and backscattered electron signals, while minimizing the charging of the specimen. HITACHI S 8840 also features a high-resolution field emission gun (FEG) which can be used to achieve higher resolution imaging. FEG enables high-quality sub-nanometer imaging and high-speed scanning imaging at up to 0.75 milliseconds per frame. Moreover, S-8840 is well equipped for advanced applications such as in-situ micro-manipulation, in-situ chemical analysis, and real-time 3D-reconstruction. In-situ micro-manipulation allows for precise control over the specimen and subsequent analysis. With in-situ chemical analysis, direct chemical analysis of a specimen can be done in the SEM chamber, with the sample placed in-situ, avoiding the need to move it to a separate analytical chamber. With real-time 3D-reconstruction, high-precision 3D images are created by recording images of the specimen surface as it is rotated. Finally, S8840 has an innovative auto-shading correction function that automatically adjusts the detector gain, enabling better-quality imaging of non-uniform surfaces. In short, HITACHI S-8840 is an advanced scanning electron microscopy machine with a wide range of features and capabilities. It offers excellent imaging quality and elemental analysis capabilities, thanks to its integrated vacuum tool and various detectors. Its advanced functions make it an ideal solution for high-precision surface measurements and characterization.