Used HITACHI S-8840 #9077722 for sale

HITACHI S-8840
ID: 9077722
Vintage: 1999
CD SEM, 1999 vintage.
HITACHI S-8840 is a scanning electron microscope (SEM) that allows for the viewing and analysis of objects on both the macro and micro levels. It is a powerful and advanced instrument used for a variety of scientific investigations such as examining cell and tissue morphology, semiconductor material growth, the observation of defects on surfaces, the analysis of crystal structures, and more. HITACHI S8840 is composed of several sophisticated components, including a monochromatic electron-optical equipment, an energy-dispersive X-ray (EDX) system, a back-scattered electron (BSE) detector, and a crystalline unit for quantitative analysis. The monochromatic electron-optical machine is capable of a high degree of resolution and imaging speed due to its advanced electron optics and electron gun technology. The EDX tool enables elemental analysis of the sample over a wide detection range. The BSE detector is used to acquire surface images covering a broad range of magnifications, revealing intricate features and textures of the sample. Lastly, the crystalline asset measures the diffraction angles of the sample to allow for the successful identification of known crystal structures. S 8840 is also equipped with a digital megaviewer imaging detector that can provide imaging data in 1-megapixel resolution, allowing for crystal structure identification and high-resolution imaging with much greater precision than would be possible with a conventional SEM. S8840 also boasts a high-sensitivity secondary electron detector which can capture low-energy secondary electrons to generate low-magnification images at high magnifications. S-8840 also has several image-processing functions to facilitate the optimization of imaging results and to reduce analysis time. In conclusion, HITACHI S 8840 is an advanced scanning electron microscope that provides an unprecedented level of detail and accuracy to scientific research endeavors, from surface and elemental analysis to crystal structure identification. Its powerful features and components make it an invaluable tool for a variety of technical applications.
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