Used HITACHI S-8840 #9194907 for sale
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ID: 9194907
Wafer Size: 8"
Vintage: 1997
Scanning electron microscope, 8"
1997 vintage.
HITACHI S-8840 scanning electron microscope is a versatile analytical tool specifically designed for examining the surface of metallic, glass and complex shapes samples. This microscope allows the user to analyze materials at small scales, as small as a few nanometers, by using a specialized electron beam to create images of a specimen on a digital display. It is capable of producing high-resolution images of tiny particles and deformation characteristics with a resolution of 1nm or less. HITACHI S8840 microscope utilizes a wide range of analytical techniques such as Energy Dispersive X-ray (EDX) and Wavelength Dispersive X-ray (WDX) spectroscopy. It features a high accuracy stage driven by three-axes motors, with a high reproducibility of geometry measurements. The included sample handling functions and auto alignment feature allow for a wide range of customization for the user's application. S 8840 offers ease of maintenance due to its simplified design, and convenient features such as a air-cooled electron optical column and a monitor that can be switched from the monitor to the image and back, as well as an adjustable height control for each microscope. The microscope also features an additional support unit for accurate specimen manipulation and sample positioning. HITACHI S 8840 also offers a high-resolution TEM camera unit, which is used for material analysis and as a powerful imaging tool. This camera unit is equipped with a back-illuminated CCD image sensor and an electron-optical lens. The TEM camera allows the user to obtain low noise and high contrast images of a specimen. S8840 is the choice of those seeking a reliable, high-grade microscope that can produce high-resolution images. It is an ideal tool for universities conducting research, as well as industrial and medical applications. This microscope is an efficient and effective way to analyze all types of materials, as well as for providing accurate measurements and efficient sample handling.
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