Used HITACHI S-8840 #9236032 for sale

HITACHI S-8840 is a scanning electron microscope (SEM) that is capable of producing high resolution images and analysis of the surface of solid specimens. This advanced microscope utilizes a high-resolution everhart-thornley type secondary electron detector, which produces images with a lateral resolution of 0.9nm and secondary electron contrast up to 98%. This instrument is also equipped with a Tungsten filament X-ray generator capable of producing up to 30kV accelerating voltage and 9.1nm Pd-based source-detector distance. This enables fast X-ray acquisition, as well as high energy resolution. This microscope is a vacuum equipment that features an integrated vacuum chamber and chamber pump designed to produce an ultra-high vacuum environment. This enables the instrument to produce high quality images, thanks to minimal background noise. The specimen holder is also able to withstand 10kas irradiation dose, enabling the user to study a wide range of materials and specimens. HITACHI S8840 also features a new three-dimensional e-beam control system, which allows the user to precisely control the electron beam and acquire highly accurate images. This unit is capable of tracking the specimen during change of tilt, rotation and even magnification. Furthermore, the variable astigmatism and spatial filtering systems are designed to drastically reduce noise and increase image quality. Finally, this SEM is also equipped with a Bit MIDI/PAR (Pixel Area Readout) machine, which allows the user to observe pixels in a digital mosaic-like pattern. This tool enables the user to obtain high resolution images in even the most minute sections of the specimen. The combination of all these features, enables S 8840 to produce exceptional high-resolution images capable of providing clear, detailed information for the study of materials and surfaces.