Used HITACHI S-8840 #9236750 for sale

HITACHI S-8840
ID: 9236750
Vintage: 1997
Scanning Electron Microscope (SEM) 1997 vintage.
HITACHI S-8840 is an advanced scanning electron microscope (SEM) that provides both imaging and spectroscopic capabilities in a single instrument. The instrument is a collaborative joint venture between HITACHI High-Technologies Corporation and Oxford Instruments, and utilizes technologies such as dynamic-secondary-electron (DSE) imaging, energy-dispersive X-ray spectroscopy (EDX) and wavelength-dispersive X-ray spectroscopy (WDS). This SEM is equipped with an advanced detectors and X-ray detectors, both of which are placed in the column of the microscope. The detectors act as both optics and detectors, allowing the user to make simultaneous measurements during SEM operations. The imaging capabilities of HITACHI S8840 include a best-in-class resolution of 1.4 nanometers and a working distance of 5mm to allow for zoom-in and out imaging. It is also capable of a variable chamber pressure ranging from 10-7 to 10-2 torr, allowing a range of surface analysis techniques. The SEM's spectroscopic capabilities are also excellent, with a high resolution EDX system and a WDS system. The EDX Spectrometer is equipped with a fast 20 second live time readout and 10KV accelerating voltage. WDS system offers a maximum resolution of 100 eV, enabling the user to observe both contaminated non-metallic elements and trace elements in a single operation. In addition, S 8840 comes with the "S-Control PC" software that enables the highly versatile automation of SEM operation. This software allows the user to automate repetitive tasks, generate different types of plots and analyze raw data sets with ease. Overall, S-8840 provides excellent scanning electron microscopy capabilities and spectroscopic capabilities that make it a staple in both industrial and academic research. Its advanced detectors, imaging capabilities and software allow it to make breath-taking measurements while its spectroscopy capabilities enables it to analyze both metallic and non-metallic elements.
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