Used HITACHI S-8840 #9245272 for sale

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ID: 9245272
Critical Dimension Scanning Electron Microscope (CD-SEM) SECS / GEM Communication interface Voltage: 500 V to 1300 V, 10 V steps Probe current: 1-16 pA at 800 V, 1-10 pA at 1000 V, 1-13 pA at 1300 V 3-Stage electromagnetic lens system 2-Stage deflection scan coil Magnification: 1000x to >150000x Resolution: <8 nm at 700 V - 1000 V Depth of focus: ≥1.0 mm at 80000x magnification Optical microscope system: Monochrome CCD Camera Magnification: 10x Wafer imaging X & Y coverage from 5-195 mm Notch down.
HITACHI S-8840 scanning electron microscope (SEM) is a versatile and reliable instrument for applications in the physical and materials sciences. With its combination of advanced and user-friendly technologies, HITACHI S8840 is designed to meet the most stringent requirements of researchers in a range of fields. S 8840 provides a high resolution, extended depth of field, and a wide field of view, making it ideal for a range of uses. Its unique Tomoscan feature enables the operator to observe ultra-thin cross sections of samples for analysis, submicron image resolution, and 3D view analysis. S-8840 also boasts a multimodular system with a choice of modules for different function requirements, such as elemental and crystallography analyses, and auto stage scanning. S8840 is designed with a high-vacuum and low-vacuum (LV-) mode option, making it suitable for a variety of samples and applications. Its streamlined operation, including auto-tune fine focus and energy filters, enables quick and precise sample analysis. The integrated Auto MAGIC image contrast and parametric automatic calculation provide high-quality imaging. HITACHI S 8840 also offers a range of optional accessories, such as a stage wobble correction device, detector boxes, various lenses and detectors, and scanning electron diffraction (ED) system. With its high resolution, accurate imaging, and wide range of analytical capabilities, HITACHI S-8840 is an invaluable tool in the laboratory. In addition, HITACHI S8840 features intuitive user-friendly controls, detailed manuals, and comprehensive digital user support for easy operation. This combination of features and enhanced operation allows for increased analysis efficiency. For example, the microscope is capable of multi-sample analysis and advanced data analysis through data port rental, remote control operation and sample mapping. S 8840 scanning electron microscope is a reliable and powerful tool for physical and material sciences. Its advanced features and intuitive operation make S-8840 ideal for a variety of uses. As such, S8840 is an invaluable instrument for laboratories and research facilities.
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