Used HITACHI S-8840 #9250666 for sale

HITACHI S-8840
ID: 9250666
Scanning Electron Microscope (SEM).
HITACHI S-8840 is an advanced scanning electron microscope (SEM) designed for high-resolution imaging and particle analysis. It features a digital imaging equipment with a host of high-precision features and ergonomic design for intuitive operation. The microscope is well suited to a wide range of applications, including surface science, nanotechnology and metallography. HITACHI S8840 achieves ultra-high resolution imaging with a maximum magnification of 500,000x and a working distance of 0.7 to 6.0mm. For improved accuracy and stability, its beam control system incorporates a four-quadrant Faraday cup in the condenser lens. S 8840 also includes a high-intensity ultra-bright vacuum field emission gun with a resolution of 2.0nm and a lifetime of up to 20,000 hours. For added convenience and precision, the SEM is equipped with a deflector, aperture grid, and rotational beam deflection unit. The integrated digital imaging machine provides excellent contrast, brightness and resolution and utilizes a monochrome display. Automated features include automatic focusing, viewing mode and aperture selection. The digital imaging tool is equipped with a host of image analysis tools, including grain size and shape analysis, image intensification, line profile analysis, area and length measurements, and shrinkage measurements. For improved safety, S8840 is designed with an automated residual dose protection asset and an integrated vacuum pump protection model. The equipment also features a host of other advanced features such as an automated stage drive system, a digital video microscope, a built-in digital printer, and 40GB of internal data storage capacity. Overall, HITACHI S 8840 is a powerful and robust scanning electron microscope boasting an impressive level of performance and ergonomics. With its impressive array of features and advanced imaging capabilities, the microscope is an effective and reliable tool for a variety of particle analysis and imaging applications.
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