Used HITACHI S-8840 #9265780 for sale
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ID: 9265780
Wafer Size: 4"
Vintage: 2001
Critical Dimension Scanning Electron Microscope (CD-SEM), 4"
With MECS UTC 100A Robot
AGILENT / HP / HEWLETT PACKARD / KEYSIGHT B180L
High voltage controller: 54,730 Hours
Cables
Isolation transformer
(4) Vacuum houses
GEM/SECS Interface
Load lock turbo controller: LEYBOLD HERAEUS TurboVac 50 / Turbotronik NT 10
Process chamber turbo controller: LEYBOLD HERAEUS TurboVac 340M
Power supply: 208 V
CE Marked
2001 vintage.
HITACHI S-8840 Scanning Electron Microscope (SEM) is a state-of-the-art scanning electron microscope equipment suitable for imaging materials with a high degree of detail. This microscopy system consists of a 300 kV electron gun, a focused ion beam (FIB) column and an optical unit. HITACHI S8840 can be used for both transmission and secondary electron imaging. The specimen chamber of S 8840 unit is designed for operation in standard laboratory conditions. The electron gun of the machine is equipped with a focusing lens, which focuses the beam to a desired spot size, as well a condenser lens responsible for collecting electrons from a wide range of angles. The FIB column is equipped with a scanning mirror and a beam tilt tool, which allow for precision sample preparation and imaging. The asset is also capable of producing a low-kV backscattered electrons (BSE) image, a process that yields information about the elemental composition of the sample. The optical unit in S8840 consists of a field-emission display (FED) and a liquid crystal display (LCD) that are used to observe the samples being imaged. Total magnification magnifies up to 50,000x, while the maximum resolution of HITACHI S 8840 model reaches 0.2 nm. The microscope has a maximum sample size of 25 x 25 mm. In addition to imaging capabilities, S-8840 equipment includes several other unique features, such as fully automated image acquisition and acquisition control, as well as a 'Level of Detail' image enhancement system. The unit also supports a wide range of accessories and add-ons, such as stage automation and an X-ray detector for measuring X-ray fluorescence. Furthermore, the machine comes with an environmental periphery such as an environmental chamber, a vibration-reduction mount and the ability to control gases. HITACHI S-8840 tool is a reliable and high-end SEM asset designed to meet the most demanding imaging needs and can be used for industrial, biological and material research. The microscope is highly configurable and customizable and can be tailored to meet individual needs. HITACHI S8840 model offers excellent image quality, ease of use and provides a comprehensive range of capabilities suitable for researchers and technicians.
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