Used HITACHI S-8C40 #139924 for sale

HITACHI S-8C40 is a scanning electron microscope (SEM) with a unique combination of high resolution, large field of view, and ease of use. The instrument offers a wide range of capabilities from high-resolution imaging to elemental analysis and 3D reconstruction. S-8C40 is equipped with a high resolution, large-area secondary electron (SE) detector for imaging and an energy dispersive x-ray spectrometer (EDS) for elemental analysis. Additionally, the microscope comes with an optional low vacuum system for higher quality imaging. HITACHI S-8C40 has an acceleration voltage range of 1-20kV, which allows for imaging and analysis of a variety of samples with high accuracy. The high resolution secondary electron detector ensures sharp images with high magnification. The SEM also has an automated filming device that allows images to be stored and viewed at any time. Additionally, S-8C40 has an automated stigmator which allows for precise adjustments of the scanning beam. HITACHI S-8C40 supports rapid 3D reconstruction analysis using the optional software. This allows for the generation of the image data into 3D models in just a few clicks. The software also allows for the adjustment of parameters such as magnification, rotation, and other settings. The 3D reconstruction analysis is useful for various studies including morphological and structural analysis. Furthermore, S-8C40 can provide elemental analysis of samples using the installed energy dispersive x-ray spectrometer (EDS). This is done by registering the characteristic x-ray emitted from the specimen in order to identify the elements present. The EDS can operate in both SEM mode and in transmission electron microscopy (TEM) mode for a comprehensive elemental analysis. In conclusion, HITACHI S-8C40 is a versatile scanning electron microscope which can be used for a variety of applications ranging from high resolution imaging to elemental analysis. The SEM offers an advanced feature set including a high resolution secondary electron detector and an energy dispersive x-ray spectrometer (EDS) for rapid 3D reconstruction and elemental analysis. The hardware and software features of S-8C40 ensure high quality images and accurate analysis of specimens.