Used HITACHI S-9200S #9173736 for sale

ID: 9173736
Wafer Size: 8"
Vintage: 2000
CD Scanning electron microscope (SEM), 8" Install type: Stand-alone Cassette interface: (2) Open cassettes Display monitor for alignment User interface module Power rack with UPS Includes: Chiller Facility requirements: CDA Vacuum Power: 230VAC (6kVA) Frequency: 50 Hz Software version unix V10 Sytem version 15.22 Version logical HITACHI HOST 15.20 Version logical HITACHI SEM 15.20 Version logical HITACHI IPS 15.21 (4500) Version logical HITACHI SEM_V Version logical HITACHI IPS_V Version logical HITACHI VIPS Version logical HITACHI stage 01.07 Version logical HITACHI EVAC 02.01 Version logical HITACHI HV 04.02 Version logical HITACHI WT 03.07T Not included: Backing pump 2000 vintage.
HITACHI S-9200S is a scanning electron microscope (SEM) specifically designed for high-resolution imaging of small samples. It is fitted with a Schottky field emission electron gun and a low-noise secondary electron detector, enabling HITACHI S 9200 S to obtain high-contrast images without drifting. Equipped with high-resolution lenses, a digital closed-circuit television camera and fast image storage, S-9200S can provide precise images of delicate and micro-scale structures and fine features. It is able to magnify the sample up to 500 kX and has a resolution of 2.4 nm. In order to give its users a better experience, the touch-panel operation panel provides intuitive operations. It is equipped with an image analysis software that has the ability to process large volumes of data efficiently, allowing users to analyze their samples without having to learn complex programming. S 9200 S also offers various image pre-processing functions such as erosion, de-skew and panning for automated sample analysis. When performing low vacuum and high vacuum measurements, HITACHI S-9200S is able to maintain a high level of control for both pressure levels without having to switch between high vacuum valves. The microscope is also incorporated with several operational features that make it attractive to users. Some of these features include automated temperature and gain adjustments that are able to optimize the imaging conditions. It is also possible to use a semi- or fully automated sample movement system for scanning and imaging. In addition, HITACHI S 9200 S has a low vibration system that minimizes the mechanical disturbances that can disrupt the measurement process. The aluminum frame of the system is highly rigid, ensuring that the vibrations generated by the electrical and mechanical components do not have an significant effect on the images or measurements. S-9200S has many more features that further increases its value to users. This includes a range of detectors and stage systems that allow users to adjust the settings in response to the requirements of the experiment. Furthermore, S 9200 S is designed to be easily integrated with other systems for easy data acquisition. With the combination of all these features, it is not surprising that HITACHI S-9200S is a popular choice among SEM users.
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