Used HITACHI S-9220 #112770 for sale

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ID: 112770
Wafer Size: 8"
Vintage: 2000
CD SEM, 8" CD Scanning Electron Microscope, 8" Upgraded from HITACHI S-9200 Specifications: Control unit: HITACHI 19" monitor HP 132 work station Keyboard and mouse MO driver 80 col thermal printer Image printer: MITSUBISHI P-91 LAN hub and modem E/O creating: ECPU and control PCB Main body: Loader chamber Wafer holder Exc chamber and arm HV control unit (2) Turbo pumps and controllers OM camera (2) SEI detectors Lens power supply Lens controller EVAC power supply Stage power supply EVAC controller OM light unit Stage controller C to C unit: Robot controller (2) Area sensor controllers Wafer pre-aligner Robot and arm (2) Cassette indexers: 8", open Power unit: Ion pump power UPS Power distribution unit Baking control unit (2) Dry pumps MO disk: HITACHI software Weight block: includes (4) vacuum hoses Chiller 2000 vintage.
HITACHI S-9220 scanning electron microscope (SEM) is a powerful tool for microstructural imaging. It features a 3-in-1 secondary electron detector, low kV accelerating voltage, and a highly stable in-lens-type detector. HITACHI S9220 has a large gun lens to provide a highly stable accelerating voltage, allowing for improved image resolution and quality. The 3-in-1 secondary electron detector provides high-resolution images with a great level of detail and contrast. The low kV accelerating voltage allows low kV imaging of conductive samples and the in-lens-type detector enhances precise control over the electron beam. S 9220 is a great choice for research and development. It is powered by a high-capacity charge coupled device (CCD) imaging system and offers an advanced software package for precise control of the electron optics. This allows users to explore and analyze microstructures on the nanometer scale, providing an automated way of measuring sample properties. S9220 also offers a variety of different sample preparation and imaging capabilities. The sample holder can accommodate a wide range of materials, and can be rotated for easier imaging of the exact orientation of the sample. The sample holder can also be used to mount multiple samples, making it ideal for comparative studies. S-9220's back-scattered electron (BSE) imaging mode allows for rapid imaging and quantitative analysis of phases in two-dimensional (2D) images. Low vacuum (L-V) imaging also allows imaging of samples with non-conductive surfaces without the need for coating. HITACHI S 9220 has been designed to provide outstanding performance and reliability. The user-friendly interface allows new and experienced researchers to quickly become familiar with its features and control. The system is also designed with a range of safety features, ensuring the protection of its users and their samples. HITACHI S-9220 provides amazing imaging capabilities and precise control, making it the perfect choice for research and development. Its detection sensitivity, ease of use, and reliability make it the perfect tool for exploring and analyzing microstructures.
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