Used HITACHI S-9220 #293608917 for sale

HITACHI S-9220
ID: 293608917
Wafer Size: 8"
Critical Dimension Scanning Electron Microscopes (CD-SEM), 8".
HITACHI S-9220 is a scanning electron microscope (SEM) designed for high resolution imaging and analysis of electrical and mechanical components. This state-of-the-art microscope features a high speed, large field of view, high-ambient stigmation, and large scan area, allowing for comprehensive examination and analysis of components. HITACHI S9220 offers a wide range of imaging capabilities, and its advanced design facilitates quick and accurate data collection. S 9220 is outfitted with an automated stage, allowing for precise positioning and manipulation of samples, and automated alignment with the electron beam. It is capable of quickly and accurately scanning large areas, with a magnification range that accommodates applications in semiconductor engineering, contaminant analysis, and more. It is also equipped with a multi-beam optimal electron gun, as well as multiple detector systems. S-9220 also features a high-resolution secondary electron detector, giving users the ability to image features such as cracks, impurities, and contaminants. Its low energy backscattered electron detector offers a variety of imaging modes, making it suitable for examining the surface composition of samples and evaluating their chemical composition. Additionally, its shear-force and lateral force mode allows the user to identify and measure the physical properties of samples, such as hardness and Young's modulus, respectively. In addition to its electron imaging capabilities, HITACHI S 9220 also includes a high-quality optical system with both reflected light and transmitted light. This offers a higher level of detail while allowing users to view and measure 3-dimentional features. S9220 also includes a high-precision tilt mechanism, allowing users to investigate the shape and characteristics of bottom-up surfaces. HITACHI S-9220 also makes use of advanced software for imaging, analysis, and quantification of data. This software allows the user to manipulate images, generate contours, create maps, and measure a wide range of features. As well as providing imaging capabilities, HITACHI S9220 is also equipped with sample manipulation features, such as a carbon dioxide gun for metal sputtering or a sloshing station for coating samples with protective layers. Furthermore, the software also allows for remote control of the microscopy system from any computer, giving great flexibility to users. Overall, S 9220 is a powerful and versatile scanning electron microscope, delivering both high resolution imaging and analysis of samples. By combining multiple imaging capabilities, sample manipulation, and remote control software, S-9220 can be used to efficiently and accurately perform complex examinations, providing invaluable data for researchers.
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