Used HITACHI S-9220 #9088331 for sale

HITACHI S-9220 is a scanning electron microscope (SEM) used for high-precision imaging and analytical analysis. CTEM (creative transmission electron microscopy) imaging can be applied to observe the microstructure of samples in three dimensions in order to obtain detailed information. In addition to this, an energy dispersive X-ray spectrometry (EDX) detector for element analysis of the sample in a cross-section view and a WDS (wavelength-dispersive X-ray spectrometer) detector for compositional analysis of the sample are also available. The highest magnification of the system reaches 500,000x. Such high magnification makes it possible to observe materials on an atomic/nanoscale level. The observation of a wide range of samples including metals, ceramics, polymers, semiconductors, device, biomaterials, and so on is made possible by the large vacuum chamber with a maximum specimen size of 200 mm. The 4-axis stage is capable of a maximum speed of 0-4°/sec. The system's incorporation of an auto-focusing sensor ensures accurate focus on different specimen thickness. The ultralow vacuum fucntion ensures low charging of samples with extremely low temperatures, which is beneficial for observation of organic materials. The high-resolution CCD camera system captures clear images and video of the specimen. The color reproduced from the image is natural, which facilitates quantitative evaluation and precise analysis. The software controls the tension as well as electron beam coordinates. It can be used for tomographic reconstruction, it increases contrast, and more. The beam voltage of HITACHI S9220 ranges from 1.9 to 20 kV. It is equipped with a high-gain detector for a very sensitive detection of radiation count of X-ray and elastically scattered electrons, as well as backscattered electron imaging. In short, S 9220 is an advanced, high-precision scanning electron microscope. It offers wide-ranging observation capabilities with extreme accuracy, allowing quantitative evaluation and precise analysis of samples on atomic and nanoscale levels. It is a powerful tool for a variety of research and applications.