Used HITACHI S-9220 #9095785 for sale

HITACHI S-9220 scanning electron microscope (SEM) is a next-generation scanning electron microscope with superior performance in analytical and imaging capabilities. With its high-stability electron beam, it is a reliable tool for high-resolution imaging, elemental analysis, and other materials characterization experiments. HITACHI S9220 is a variable pressure scanning electron microscope that is capable of operation in both UHV (10^-8 - 10^-10 Pa) and LVP (10^-1 - 10^-2 Pa) environments. This versatility allows for operation of a wide range of experiments, maximizing the capabilities of the microscope. It is equipped with a powerful field emission electron emitter, which results in a stable and accurate electron beam. S 9220 also features an increased detection efficiency compared to its predecessors, allowing for more accurate imaging and elemental analysis data. With its unique space charge corrected optics, HITACHI S 9220 allows for aberration-free images even at low magnifications. This feature is particularly beneficial for studying large samples, such as those with complex geometries or large features. S-9220 is designed with a large and ergonomic specimen chamber, allowing for easy sample positioning and handling. It features a 7-axis motorized stage, which allows for precise automated movements of the sample for both imaging and analysis purposes. Additionally, it is equipped with a cryo cooling stage for temperatures down to -180°C. For elemental analysis, S9220 is equipped with an energy-dispersive X-ray (EDX) spectrometer that is capable of detecting elements with atomic numbers between 4-96. The EDX system also features a large silicon drift detector (SDD), increasing its detection sensitivity. Furthermore, a wavelength-dispersive X-ray (WDX) spectrometer, that is able to detect elements with atomic number between 11-92, is also integrated to the microscope. HITACHI S-9220 is a powerful scanning electron microscope, combining the cutting-edge technology of a top-of-the-line SEM with a variety of capabilities for a wide range of experiments. With its improved electron optics, increased detection efficiency, and advanced automation capabilities, it is an ideal SEM for material research and characterization.