Used HITACHI S-9220 #9099556 for sale

HITACHI S-9220 is a scanning electron microscope (SEM) designed to provide high-resolution imaging of both surface and cross-sectional specimen features. With its unique integrated Multi-Focused Ion Beam (FIB) module, HITACHI S9220 is capable of performing precision milling, imaging, thin-film deposition, and other innovative material analysis techniques. The system is equipped with a source of electrons and a viewing and imaging system. The electron source produces high-energy electrons from a tungsten filament. The electrons are then accelerated through two electrostatic focusing lenses and focused onto the sample surface. When the electrons reach the sample, interactions with the atoms create secondary electrons, which can be detected at the surface. The back-scattered electrons are recorded and used to produce an image of the sample and measure the concentration of specific elements. Another feature unique to S 9220 is its Multi-Focused Ion Beam (FIB) module, which allows researchers to perform precision milling, imaging, thin-film deposition, and other innovative material analysis techniques. The FIB utilizes a focused ion beam to mill away small areas of the sample surface and create a high-resolution cross-sectional image. This powerful tool allows researchers to further examine the sample's inner layers without destroying it, as well as to apply materials to the surface. HITACHI S 9220's features, coupled with its high resolution, make it one of the most advanced SEM instruments on the market. With its advanced capabilities and cutting-edge imaging technology, S-9220 gives researchers the confidence that their results are of the highest accuracy and quality. As a result, S9220 is ideal for applications that demand the utmost precision in material analysis and imaging.