Used HITACHI S-9220 #9170907 for sale

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HITACHI S-9220
Sold
ID: 9170907
Wafer Size: 8"
Vintage: 1993
Critical Dimension Scanning Electron Microscope (CD-SEM), 8" 1993 vintage.
HITACHI S-9220 is a state-of-the-art scanning electron microscope (SEM) from the renowned company HITACHI High-Technologies Corporation. It is a flagship model in HITACHI line of SEMs, featuring advanced capabilities and superior performance for the price. HITACHI S9220 has an operating voltage range of 1-30 kV, and delivers high-resolution images with its in-lens secondary electron detector. Its superior column design provides a long working distance of 200 mm, allowing users to work with a wide variety of specimens. In addition, the unit's wide field of view (17 mm) offers excellent clarity and detail when viewing samples. S 9220 further stands out from its peers with its advanced features such as in-chamber Faraday cup and an improved flat field equipment. This allows users to easily images of even low electron density areas of a sample. The multi-segment electrostatic system effectively dampens the vibration of the sample stage even at high magnifications. Moreover, S9220 is equipped with several sophisticated functions such as imaging with variable contrast, image distortion correction, and a lightning-fast live imaging capability. The unit also includes a port-mounted motorized sample magnification attachment, enabling users to easily magnify sample images up to a maximum of 500x. S-9220 also includes several powerful software packages for ultimate user convenience. This includes an advanced automated image analysis program that can instantly measure image parameters such as size, shape, and texture. Additionally, the semi-automatic image alignment machine saves time by automatically lining up images for accurate measurement even at high magnifications. In conclusion, HITACHI S 9220 is an ultra-high-performance scanning electron microscope. It has a wide range of advanced features and software packages making it ideal for precision, reliable imaging of a multitude of specimens, for a variety of experiemnts and applications.
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