Used HITACHI S-9220 #9231943 for sale

HITACHI S-9220 is a scanning electron microscope (SEM) with high-end performance needed for advanced materials characterization, research, and industrial applications. It allows users to access a comprehensive range of imaging and analytical capabilities. This field emission scanning electron microscope (FE-SEM) features a high performance field emission electron gun with chamber pressures as low as 1x10-7 Pa, making superior imaging resolution of 1nm achievable. HITACHI S9220 boasts an ultra-stable column design for imparting higher electrical currents till 60 nA at temperature regulation below 2.0℃. Additionally, the 300kV acceleration voltage provides enhanced imaging resolution. S 9220 is equipped with many unique features. For instance, the Inlens and Everlens detectors display secondary electron and back scattered electron imaging which improves resolution and surface topography. Another feature is the high-speed scan stage which can provide a maximum scan rate of 4.5 μ/s on a 100 μm XY field of view. Also, the ultra-high vacuum chamber can provide chamber pressure down to 1x10-7 Pa to help prevent sample contritions and reduce ion beam damage. S-9220 is able to acquire a variety of analytical information. Energy Dispersive X-ray Spectrometry (EDS) enables elemental composition analysis. An EBSD detector allows the acquisition of orientation maps, phase identification, semi-quantitative analysis of grains as well as the measurement of chemical composition. Additionally, the in-column Cs corrector allows astigmatism correction for fast focus adjustment. S9220 FE-SEM also displays various sample preparation techniques for organic materials. Atom probe tomography, secondary ion mass spectrometry, laser microscopy, and focused ion beam (FIB) capabilities can be added to further enhance the instrument capabilities. Furthermore, EDAX offers a Galaxy module with the unique capability to link HITACHI S 9220 SEM and EDS detector with the Inlens detector of the microscope. The Hirox camera and the SEMcore stage collision protection system also provide vital safety features to the user. The SEMcore collision protection system will automatically stop the stage to prevent the user from damaging the sample. With its enhanced imaging and analytical performance, HITACHI S-9220 is the perfect tool for materials characterization and research.