Used HITACHI S-9220 #9236031 for sale

HITACHI S-9220 is a scanning electron microscope (SEM) that utilizes a field emission gun and is suitable for high-precision observations. It offers a maximum resolution of 0.22 nm at high magnification and a maximum magnification of 300,000x. HITACHI S9220 is also equipped with a motorized X-Y sample stage, allowing for automated sample scanning and precise specimen alignment. The SEM is capable of multi-element analysis and other analytical processes such as EDX-PAC and SAC, as well as enhanced imaging modes with high contrast such as electron beam-induced current (EBIC) and energy dispersive spectroscopy (EDS). S 9220 also features a scanning ion microscope (SIM) for observing surface structure information. S-9220 uses an in-column conformal lens to reduce artifacts from the electron beam, resulting in images with high accuracy and clarity. A specially designed viewing screen and projection optics provide a bright, three-dimensional view, great for observation. In addition, the system has a wide depth of focus for displaying features at different depths with little development time. S9220 is designed for top of line performance and features user-friendly control and operation. It is equipped with a variable working distance, automatic sample detection, and quick magnification changes. The system comes with comprehensive software, offering an intuitive user interface for image acquisition, analysis, and data processing. The size and design of HITACHI S 9220 allow for easy access to the specimen chamber. Sample holders also permit observation of samples in the vacuum environment. An Automatic Ejector System prevents contamination of the chamber from specimen residual. In summary, HITACHI S-9220 is a powerful and reliable SEM that offers superior imaging capabilities and accuracy. With a maximum resolution of 0.22 nm, multi-element analysis, motorized XY sample stage, enhanced imaging modes, and user-friendly software, it provides a top of line performance and assurance for successful sample observation.