Used HITACHI S-9220 #9240736 for sale

HITACHI S-9220 scanning electron microscope (SEM) is an advanced imaging equipment that utilizes a focused electron beam to generate high-resolution images of a wide variety of specimens. HITACHI S9220 is designed for high performance and features a variety of imaging and analysis capabilities. S 9220 is a scanning electron microscope equipped with an electron column and a pair of high-precision motors. The electron column consists of an Electron Optics Drawer, Stage Console, Column Assembly, and Scintillator Unit. These components all work together to produce detailed images of samples. The Electron Optics Drawer contains an electron gun, condenser lenses, and condenser aperture. The electron gun is used to produce the electrons that will be used to scan the sample. The condenser lenses focus the electron beam and the condenser aperture limits the size of the beam that is used to scan the sample. The stage console contains the sample stage, the x-y x-ray axis, and the energy filtering system. The sample stage is used to hold the specimen for the scan. The x-y x-ray axis is used to move the electron beam during the scan. The energy filtering unit is used to remove unwanted x-ray radiation during the scan. The Column Assembly is used to keep the electron beam from scattering during the scan and to provide higher resolution images. The Scintillator Unit allows the operator to detect x-ray radiation that is generated during the scan. In addition to its electron optics capabilities, S-9220 is equipped with a variety of imaging and analysis capabilities. It is capable of operating in both low and high vacuum modes, and is equipped with features such as a digital signal processor with up to 16 channels, digital signal enhancements, and an erase mode. HITACHI S 9220 is also equipped with an automated search and focus machine, a sample surface-pedestal detector, and an automated gain and focus detector. S9220 is an ideal instrument for examining microstructures of a wide variety of samples. It is capable of providing high resolution images in both low and high vacuum modes. With its various imaging and analysis capabilities, it is suitable for research, development, inspection, and production applications.