Used HITACHI S-9220 #9250489 for sale

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HITACHI S-9220
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ID: 9250489
Scanning Electron Microscope (SEM).
HITACHI S-9220 is a scanning electron microscope (SEM) designed for use in research and development, as well as in the fields of industrial and educational examination. This microscope utilizes electron beams, which makes it possible to obtain detailed images of materials at nanometer resolution. HITACHI S9220's operation utilizes a secondary electron detector, backscattered electron detector, total secondary electron imaging, and far-field electron detection. The detectors are capable of capturing multiple images of a sample simultaneously, and can be used with either a ground shield or a high voltage shield. The microscope is composed of a a large chamber structure with a useable volume of 120L. On the side walls of the chamber are a pair of vertical stages. The stages are capable of precisely moving the sample in the X, Y, and Z axis. Additionally equipped are a two-arm stage and a high voltage shield to manipulate the sample even further. The microscope is connected to a personal computer, where imaging data can be transferred and analyzed. To generate the electron beam, S 9220 deploys a tungsten filament electron source. The filament is heated to several hundred degrees Celsius to excite electrons while using a three-axis scanning system to manipulate the beam's trajectory. This allows the beam to reach different angles as required to obtain images of the sample. The generated electrons are controlled by a column lens system, composed of a selector lens, condenser lens, and objective lens. These lenses, along with the scanning system, are used to adjust focus and size of the area to be viewed on the sample. The detector section of the microscope includes both the operator side and detector side. The operator side controls the detector, while the detector side collects the electrons from the sample. It is also equipped with an impact ionization chamber for off-axis electron optics, which is able to capture the material's topography in 3D images. Utilizing a suite of advanced technology, HITACHI S 9220 provides excellent performance with both routine and difficult specimens. It is highly accurate, reliable, and able to produce images with outstanding detail. The ease of use makes it ideal for industrial, academic, and research environments.
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