Used HITACHI S-9220 #9261868 for sale

HITACHI S-9220 is a high-resolution, cold field emission scanning electron microscope (FE-SEM) designed specifically for high-magnification imaging and micron-sized feature analysis. The microscope is capable of operating at magnifications up to 150000X and resolutions down to 1.5 nm enabling highly detailed imaging and analysis of samples down to the atomic level. HITACHI S9220 uses a low-energy cold field emission electron source (CFES) for optimal electron beam stability and a 5-axis stage for high throughput sample manipulation. The CFES also helps to increase the microscope's resolution, allowing for improved imaging and detailed analysis of samples. The field emission electron source also enables the use of an Ever-Ready Beam (ERB) for imaging in low-vacuum conditions. This improves imaging and throughput performance in samples with adsorbed or evaporated molecules. S 9220 is also equipped with a variety of detectors, including backscattered electron (BSE), secondary electron (SE) and X-ray detectors. The BSE detector can be used to obtain information on a sample's topography, while the SE detector can be used to obtain elemental analysis and to observe surface textures. The X-ray detector enables the acquisition of both energy-dispersive X-ray spectroscopy (EDX) and wavelength-dispersive X-ray spectroscopy (WDX) information. HITACHI S 9220 SEM is capable of automatic specimen preparation using a range of cryogenic and focused ion beam (FIB) systems. This includes the ability to perform automated specimen alignment and sample loading, automated sequential imaging and sample grain size distribution data acquisition. This eliminates the need for manual sample loading and enables greatly increased throughput. Finally, S9220 SEM has a large 4-bay automated sample exchanger. This allows for the automation of multiple samples, with automated loading and unloading, enabling quick access to a variety of samples. This feature greatly improves both imaging and analysis throughput. Overall, S-9220 is a highly advanced, fully automated FE-SEM for high-resolution imaging and micron-sized feature analysis. Its combination of high magnification, cutting-edge CFES and automated specimen preparation systems make this an ideal choice for both imaging and quantitative analysis of highly intricate samples.