Used HITACHI S-9260 #118664 for sale
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ID: 118664
Wafer Size: 8"
Vintage: 2003
CD SEM measurement system, 8"
Configuration:
Main body:
Loader chamber
Wafer holder
(2) Exc chambers and arm
Main chamber
(2) Turbo pumps and controller
Gun head
Lens column
OM camera
(3) Ion pumps
(2) Exchange arms
Sensor amplifier
SEI detector
PM HV PCB
Status check panel
Sensor interface PCB
Lens power supply
Lens controller
Evac power supply
Stage power supply
Air pressure solenoid set
Baking tool
Cassette to cassette unit:
Robot controller
Robot and arm
(3) Cassette indexers, open, 8"
Wafer aligner
Control unit:
19" LCD monitor
HP work station
Keyboard and interface
Mouse
MO driver
80 color thermal printer
Image printer
LAN hub and modem
Emergency software unit
Service monitor: 9", black and white
System disks: (3), MO type
HV control unit
Fan unit
E/O creating:
ECPU
(4) EBS1100
COGNEX
H copy
IMEM
SIP
PSDISP
SGVA
EOCONT
OMAFC
Power supply PB
Power distribution unit
Power unit:
Ion pump power
UPS
Baking unit
Dry pumps: (2) KASHIYAMA SD-90 V III
Chiller: W5010
(4) Rubber vacuum hoses
Weight block: 40kg
2003 vintage.
HITACHI S-9260 scanning electron microscope is a reliable and versatile device for materials testing and research applications. HITACHI S9260 is a high resolution (2.0nm) SEM with the capability to measure high resolution images, elemental mappings and quickly identify microstructures. Its core expertise is in materials science, nano-scale imaging and defect analysis of organic and metallic substrates. S 9260's high precision stage and beam control enable accurate analysis of small nanoscale objects and features. HITACHI S 9260 uses advanced electron gun technology, a Zeiss Schottky electron optics system and a Lanex / Super-Lanex detector to provide accurate, clear images that make it possible to easily identify microstructure and defects. It is a PCI compliant instrument, meaning that its components and software can be used with most PC systems. This allows the microscope to be easily updated to keep up with the latest technology and trends. S9260 offers both advanced automated analysis and manual operation capabilities. It works with the user to customize the conditions, including beam current, magnification (up to 50,000X), acceleration voltage and more. With materials testing functions such as back scattered imaging, X-Ray diffraction, WDS (wavelength-dispersive spectroscopy) and EDS (energy-dispersive spectroscopy), S-9260 is able to provide detailed information about the microstructure of metals, ceramics and polymers. Compatible with two-dimensional and 3D image stacking, HITACHI S-9260 provides high resolution and high quantification images. It also provides the option of mapping various kinds of elements, including those on the periodic table, using an additional EDS detector. With functions such as automated particle feature measurement, systematic image creation for image mosaicking and 3D tomography, HITACHI S9260 can cover a wide range of materials testing and analysis projects and applications. Overall, S 9260 scanning electron microscope is an incredibly powerful and reliable device for materials testing and research. Equipped with advanced automated analysis capabilities, customizable functions and the ability to customize the detection of different elements, it is an essential instrument for laboratories and research purposes.
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