Used HITACHI S-9260A #293608753 for sale
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HITACHI S-9260A is a high-resolution scanning electron microscope (SEM) designed for imaging, characterization, and analysis of surfaces and structures in both biological and inorganic applications. HITACHI S 9260A is capable of both high-resolution imaging with a large depth of field and fast scanning rates to achieve quick analyses and data collection. The microscope is composed of a vacuum column, which houses the imaging and analysis chambers, and the range of accessories used for sample preparation and manipulation. The column utilizes the hemispherical electron gun for generating a beam of electrons at high acceleration voltages. The gun is then adjusted to magnify the sample by focusing and accelerating the electrons in proper trajectories. Once the beam is directed, the secondary and pole pieces create an electromagnetic field for projecting images of the specimen onto the viewing screen. S-9260 A's imaging chamber can switch between three types of electron detectors and the x-ray detector. The electronically adjustable incident electron beam enables the selection of both low- and high-voltage operation and controlling the angle of the beam angle. HITACHI S-9260 A is also capable of detecting and separating the x-rays generated by the electron beam, with up to two detectors available in parallel. The analysis chamber contains three lens systems and two ion guns that can be used to scan and measure the surface of the specimen. These lens systems include a high-resolution, low-voltage low-current system, a secondary electron detector (SED) system, and inorganic x-ray photoelectron spectroscopy systems (XPS). The ion guns can be used to augment the electron beam to provide efficient surface defect analysis. HITACHI S 9260 A is equipped with a wide range of accessories, such as a sample stage, holders, and specimen supports. These accessories are designed to ensure correct alignment of the sample and facilitate characterization of the sample. Further, S-9260A can be used with customized optical systems to help with accurate imaging and analysis. Additionally, advanced software can be integrated with the system to automate and streamline imaging and other analysis processes. In conclusion, S 9260 A is a high-performance scanning electron microscope that is suitable for a broad range of imaging, characterization, and analysis applications, from biological to inorganic specimens. The microscope's advanced electron beam optics and accessories, together with advanced control and automation systems, make S 9260A a powerful and versatile tool for surface and structure investigations.
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