Used HITACHI S-9260A #9177765 for sale

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ID: 9177765
Wafer Size: 8"
Vintage: 2011
Critical Dimension Scanning Electron Microscope (CD-SEM), 8" Open cassette type Missing parts: ROM PCB ST-SUB: Interface PCB MHV: High voltage control PCB Alarm: Transfer unit interface PCB Linear scale Linear scale head Vacuum valve AV6 AMP Connector 2011 vintage.
HITACHI S-9260A is a scanning electron microscope (SEM) that is widely used for exploring and analyzing the surface properties and structures of a wide range of materials. It has a number of features that make it suitable for a variety of laboratory applications. The device's most outstanding feature is its high-resolution imaging capabilities. The instrument has a powerful electron optics system and a large field of view (FOV) of even up to 200 mm. It is equipped with a high-power electron gun, which provides high-quality images. The microscope's electron optics system includes a number of devices and components, such as the condenser lens, the polepiece change mechanism, and the objective lens. The high voltage power supply of the device offers adjustable beam current for obtaining highly accurate and reproducible images. The microscope has a variety of imaging modes, such as high voltage secondary electron (HVSE), low voltage secondary electron (LVSE), back scattered electron (BSE), reflected electron (RE), and bright field scanning electron microscopy (BF-SEM). The HVSE and LVSE modes enable the user to get resolution down to 0.7nm, while the BSE, RE and BF-SEM modes are best used when comparing the surface properties of different materials and studying the microstructural features of samples. The microscope also has an optional environmental chamber, with ten different gas and vacuum inlets, for temperature, humidity, and pressure control. This feature allows the user to conduct observation and characterization of samples under controlled, reproducible conditions. The instrument is also equipped with an automatic beam blanker with optional current and voltage regulation for preventing the beam from overexposing the sample. This feature ensures that delicate materials can be observed without the risk of damage. Additionally, the device has a variety of image-processing tools, including image layers, autofocus, particle autoanalysis, and fuzzy logic tools, to further enhance image resolution. Finally, the device is equipped with a user-friendly graphical user interface (GUI). The GUI makes the instrument extremely easy to use, as the user can easily control the microscope's functions and parameters through a menu system. The GUI also offers graphical representation of the observed images and data, allowing the user to quickly interpret and analyze the results. With all of its advanced features, HITACHI S 9260A is an ideal instrument for performing precise and reliable surface analysis, imaging, and characterization.
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