Used HITACHI S-9260A #9282733 for sale

HITACHI S-9260A is a scanning electron microscope (SEM) ideal for analytical examinations. Providing high resolution imaging with penetration depths from nanometers to sub-microns, this microscope is equipped with several advanced features including an enlarged vacuum chamber, digital image resolution to 0.8 nanometers and a semi-conductive coating to prevent sample surface deterioration. This model is equipped with Silicon Drift Detectors (SDDs) which allow for high resolution imaging and high counts of electrons for enhanced accuracy. Additionally, version 5.0 of the software, TEAMS, also ensures excellent operation with a simple touch panel operation format, ease and safety of operation, and extended memory for large image storage. HITACHI S 9260A offers ten-fold multi-vacuum capability, allowing the flexibility to capture images under high vacuum, low vacuum, and even in the presence of gas. The sample holding system can be from 0 to -1000V for a wide range of specimen manipulation. Equipped with an enlarged vacuum chamber, S-9260 A is capable of examining samples of up to 10mm diameter. The specimen chamber offers both an image optimized field and a bright field for reduced particle capture. The stage can also be heated up to 250℃ for analyzing specimens that need external heat (i.e. for stress analysis). HITACHI S 9260 A offers a wide variety of operation modes depending on the type of analysis that is being performed. These modes include secondary electron mode (SE), all-digital photographic mode (ADP), backscattered electron mode (BSE), and analysis mode (AM). S-9260A also employs a semi-conductor coating to prevent surface deterioration during the imaging procedure. The coating is applied when the sample chamber is evacuated and all electron beams are eliminated. It also has an on-board cleaning device that removes excess particles from the surfaces. These features combine to make S 9260A an instrument capable of providing highly detailed microstructure images for analysis, evaluation, and research purposes. With its user friendly interface, ability to perform multiple analyses, and high resolution imaging capabilities, S 9260 A scanning electron microscope offers unparalleled performance in its class.