Used HITACHI S-9300 #293592591 for sale

HITACHI S-9300
ID: 293592591
Critical Dimension Scanning Electron Microscope (CD-SEM).
HITACHI S-9300 is a scanning electron microscope (SEM) that combines high resolution imaging with a low operating cost. It is capable of producing high quality images for a variety of applications, including failure analysis, corrosion studies, material characterisation, and semiconductor device testing. HITACHI S9300 has a newalloy-optics column that offers a number of advantages over conventional SEMs. This includes high-resolution, excellent beam stability, an ultra-wide working distance, and a small beam convergence angle. The superior optics produce images of superior clarity and precision, and the wide working distance allows for larger samples to be scanned and for a greater field of view. S 9300 also has a newly designed digital photo-optical system that maintains a constant operation between the SEM objective lens and the digital camera. This allows for a fast and accurate determination of the sample's parameters, such as apparent depth of field (ADF) and total magnification (TM) values. The three-dimensional imaging capability of the system also affords great flexibility when capturing images of samples with raised or irregular shapes. S-9300 has a vacuum chamber that is capable of producing a vacuum of 5x10-7 Pa (0.5 torr). This lends itself to high-precision imaging in situations such as high-resolution studies of corrosion or identification of high-value materials. The chamber is also capable of achieving a high degree of inert atmosphere control, making it ideal for corrosion studies or for imaging of living specimens under suspended animation for electron tomography. HITACHI S 9300 has a large, high-resolution imaging field of view (FOV) of either 4x4mm on sample size S, or 2.5 x 2.5mm on sample size M. It is also equipped with flexible, manual scan controls and a built-in joystick that allows for precise movement while observing the sample. S9300 is a reliable, user-friendly SEM that provides an excellent imaging performance and flexibility. Its high resolution and digital photo-optics make it ideal for a variety of applications, such as failure analysis, corrosion studies, material characterisation, and SEM device testing. Its vacuum chamber and inert atmosphere control capabilities provide further possibilities for advanced imaging studies. Its low operational costs, when compared to competing SEMs, are also attractive, making it a viable choice for many laboratories.
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