Used HITACHI S-9300 #9206012 for sale

HITACHI S-9300 is a scanning electron microscope (SEM) designed to provide high resolution imaging of both non-conductive and conductive specimens, with a magnifying capacity of up to 200,000x. It is specifically designed to be user-friendly and easy to operate, allowing for a quick transition from one imaging mode to another. HITACHI S9300 utilizes a fieldemission electron gun (FEG) for a brighter and more stable electron beam, in addition to providing a high level of thermal, electrical and mechanical stability and a low base vacuum. The microscope features an automated sample processing chamber and an in-lens detector with high sensitivity and fast speed, enabling users to quickly and easily switch between imaging modes, such as topographic and elemental maps. The sample stage has a motorized fine-focusing equipment, which allows for quick focusing without affecting sample parameters. Additionally, S 9300 includes an automated precision sample scanning system, which allows users to adjust scanning speed and field width, along with other settings, to optimize imaging conditions. The instrument has two detectors: an Everhart-Thornley detector for imaging surface topography and an energy filtered in-lens detectors with secondary electron imaging available for elemental analysis. The Everhart-Thornley detector can be used to maintain high resolution imaging of non-conductive and conductive samples, with imaging resolutions as high as 0.8 nm line/spacing. The secondary electron imaging capabilities of S-9300 are optimized for quick and easy use, offering resolutions of up to 0.7 nm. The ability to switch between these two imaging modes enables simultaneous imaging of both surface topography and elemental maps, while the combination of fast scanning speeds and a high level of imaging sensitivity allows for high speed mapping. HITACHI S 9300 is also equipped with a variety of additional features, including an automated sample processing chamber, a motorized sample stage, a built-in vacuum unit, and an energy-dispersive x-ray (EDX) machine with a high-speed detector. The EDX tool is extremely useful for conducting elemental analyses of various solid samples, and is equipped with an additional EDX MEGA-detector for light element analysis. S9300 is an ideal scanning electron microscope for a variety of research and engineering related tasks, and its combination of efficiency, user-friendliness, and power make it one of the best SEMs available on the market today.