Used HITACHI S-9300T #9225863 for sale

HITACHI S-9300T Scanning Electron Microscope is an advanced imaging device used to observe a variety of samples with a high degree of magnification. It is an essential tool for research, allowing users to observe a variety of physical properties in microscopic detail. This high-end scanning electron microscope is designed with a unique V-type Split Pole column, which contributes to its superior stability and image quality. It offers up to 400x magnification and resolution of 3.2nm. The V-type Split Pole equipment allows the user to acquire optimum images without needing any additional external power supply. It also features excellent contrast, low field fragmentation, and low noise levels. HITACHI S 9300 T Scanning Electron Microscope features a high-resolution detector system for capturing highly precise images of sample materials. This detector unit is equipped with an Energy Dispersive Spectrometer (EDS) for analyzing elemental compositions. It is also capable of acquiring secondary emission images with the use of a secondary electron detector machine. S-9300T is equipped with a wide selection of sample stubs, stages, and accessories to suit a variety of specimen types. It is capable of controlling high vacuum and low vacuum environments for operating with samples of different sizes and thickness. This scanning electron microscope also allows users to operate in low vacuum mode to detect particles and examine magnetic properties in materials. S 9300 T Scanning Electron Microscope is highly user-friendly and includes an intuitive control panel. This panel contains all the necessary information to operate the microscope efficiently, with a graphical control tool. It also includes an electron image analysis division to analyze defective materials as well as count them number and size. Overall, HITACHI S-9300T Scanning Electron Microscope is an advanced imaging device that offers excellent image quality, precise resolution, and intuitive control. It is an essential tool for research that enables users to analyze their samples in microscopic detail and gain an unprecedented level of insight into the physical properties of materials.