Used HITACHI S-9308 II #9258100 for sale

HITACHI S-9308 II scanning electron microscope (SEM) is an industry leading microscope that combines an ultra-high performance imaging equipment with advanced microanalysis capabilities. The system features a large sample chamber and epoxy-coated aluminum stage, as well as an ever-expanding array of cutting-edge capabilities. It is the ideal choice for analyzing materials at nanoscopic scales. S-9308 II's imaging unit is based on a low-vacuum, field emission electron source (FES) which produces a series of bright, high-contrast images. It is the most sensitive FES available in the market. This technology enables users to achieve unparalleled clarity and image quality. HITACHI S-9308 II also features a range of advanced microanalysis capabilities. It includes a full suite of energy dispersive X-ray spectroscopy (EDS) analysis tools, such as X-ray Fluorescence (XRF) and X-ray Photoelectron Spectroscopy (XPS) for elemental and oxidation state mapping, and wavelength dispersive X-ray spectroscopy (WDS) to analyze the top few nanometers of a sample. This allows users to analyze a variety of materials on a molecular level, from noble metals to polymers and ceramics. In addition to its advanced capabilities, S-9308 II has a range of cutting-edge user-friendly features. The machine comes with automated focus and stigmas functions, making it easier to acquire high-quality images and efficiently move the sample stage. HITACHI S-9308 II's electrostatic beam-deflection tool provides high-speed scan images, while its high-performance dwell time ensures optimal X-ray spectra collection. The asset is also highly versatile, with a range of options to accommodate a variety of sample sizes, shapes, and requirements. It can be used with either transmission electron microscopy (TEM) or scanning electron microscopy (SEM) imaging techniques. To ensure optimal performance, S-9308 II comes with powerful software. It includes powerful image analysis tools, as well as automated settings for controlling aspects such as magnification, stage movement, scanning mode, and specimen selection. Overall, HITACHI S-9308 II scanning electron microscope is a versatile, powerful, and easy-to-use model that provides exceptional imaging quality and superior microanalysis capabilities. It is the perfect choice for users who need to analyze materials at the nanoscopic level.