Used HITACHI S-9360 #9206010 for sale

HITACHI S-9360
ID: 9206010
Wafer Size: 12"
Vintage: 2003
Critical Dimension Scanning Electron Microscope (CD-SEM), 12" 2003 vintage.
HITACHI S-9360 Scanning Electron Microscope (SEM) is a multi-function, high- performance and versatile instrument designed for the research and analysis of biological and physical samples. It is a state-of-the-art SEM system consisting of an electronic column, a TEM/ SEM chamber, a digital image processor, and an image analyzer. HITACHI S9360 is equipped with a larger 4.5KV static stage and light-weight, foldable STEM-EM stage to analyze materials in both scanning electron and transmission electron microscopy (TEM). Additionally, S 9360 is equipped with a high-brightness X-ray detector for applications such as EDS. HITACHI S 9360 uses a field emission electron gun (FEG) with a cold filament and has an electron acceleration voltage range of 0.1 up to 30 kV, enabling it to detect much smaller objects than previous SEMs. It has a large sample chamber that can accommodate up to a 4" sample, allowing researchers to analyze larger specimens than what other SEM models offer. Moreover, it has a contrast resolution of 5 nm, giving it the capability to detect intricate details on the microscale. S-9360 is outfitted with image processing power, allowing for live image processing and digital real-time correlation with the temporal dynamics of a sample. This SEM has two main imaging modes, one that is dedicated to obtaining images at a high-resolution with a pixel sensitivity of 300V / pixel and the other that provides a wide-range of information in a single scan. Additionally, S9360 has an automated stage scanning mode for mapping large areas of a sample in a single session. The sample preparation needed for HITACHI S-9360 is significantly less than other SEM models. This is due to its low-vacuum state operation, 3000X maximum magnification, and its ability to analyse numerous sample types. HITACHI S9360 can provide slow, low-KV secondary electron imaging (SEI), also known as beam-sensitive imaging, which is useful in imaging highly beam-sensitive samples. Overall, S 9360 Scanning Electron Microscope is a reliable and advanced instrument for various applications. It offers researchers a wide range of features in SEM and TEM with its FEG, digital processor, and image analysis systems. It has high contrast resolution and a large sample chamber, making it an ideal choice for various research and analysis projects.
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