Used HITACHI S-9380 II #293639326 for sale

HITACHI S-9380 II is a scanning electron microscope (SEM) that is used in a variety of research areas, from nanotechnology and materials engineering to biology, optoelectronics and geology. The microscope is designed to capture high-resolution images of samples with highly detailed resolution in order to analyze their physical, chemical, and biological components. It is an advanced technology that utilizes a sophisticated electron beam to produce images of unprecedented accuracy and detail. HITACHI S9380 II features a top-level imaging equipment that covers magnifications up to one hundred and eighty thousand times. The system uses a high-voltage column to achieve the highest resolution possible. It also utilizes a CEMES energy imaging unit to give users access to high-resolution analysis of materials. Furthermore, the scanning electron microscope includes a highly equipped standard operating machine to ensure data accuracy and stability. The microscopes' specimen chamber is outfitted with a 360-degree sample rotation function and auto-focusing tool. This provides increased flexibility and accuracy during sample preparation, a feature that is especially useful for 3D sample observation. Additionally, S-9380-II is equipped with a high-power gun that can generate a beam current up to ten milliamps. HITACHI S 9380 II is also configurable with a number of options for advanced imaging, such as a spot size controller, retarding ratio control, and backscattered electron and STEM functions. These features allow researchers to obtain sharper images and obtain higher accuracy of image data. Furthermore, the optical asset of the microscope has a maximum incident angle of 30.3° that can be adjusted with a beam deflection voltage of up to 5 kV, as well as a digital imaging option. The ergonomic design of S-9380 II contributes to its appeal as a top-level tool. The instrument is intuitive with easily accessible knobs and buttons, as well as a programmable back-lit digital display. Additionally, the microscope incorporates multiple safety features such as an automatically cooling-down time, so the model performs optimally without risking the stability of the specimen chamber. In conclusion, S9380 II is an advanced scanning electron microscope that offers many powerful and reliable features for a range of applications. With its impressive image accuracy and detail, even the most complex research projects can be completed with precision and flexibility. Its ergonomic design and built-in safety features make it a well-equipped and capable tool that should not be overlooked.