Used HITACHI S-9380 II #293761864 for sale

HITACHI S-9380 II is a Scanning Electron Microscope (SEM) that is capable of providing high-resolution imaging and analysis within the nanometer-scale range. It is designed to facilitate a variety of applications, such as semiconductor thin-film layer evaluation, material characterization, 3-dimensional topography, and metallography. The SEM is equipped with a new type of electron gun, SuperBrightEBeam, which greatly reduces aberration and distortion of the image. This equipment utilizes a cold cathode field emission type electron source to maximize stability and ensure consistent operation. The electron beam is sensitive to a STEM(scanning transmission electron microscope) level and provides high resolution imaging. The SEM can be operated in a generic high-resolution or low-voltage mode. High-resolution mode utilizes energy filtered imaging which improves resolution and zero-loss imaging which solves secondary electrons (SE), backscattered electrons (BE), and more. Low voltage mode is better suited for imaging surface elements and organic materials. Color 3D-SE-BE image synergy is also featured. For transmission mode imaging, the SEM is equipped with a probe illumination system that illuminates the sample in broad spectrum light, reducing noise in the images. The unit is also compatible with detectors such as SE, BE and EDX to perform elemental analysis. The SEM is outfitted with a specimen chamber with a sample size capacity of 2.5 mm~10.0 mm (H) x 6.0 mm~10.0 mm (D). The specimen chamber is also designed to perform tilt and rotation of the sample, and uses vacuum functions and a gas machine to provide safe operation. The user-friendly interface makes operation simple, and all settings can be swiftly adjusted. Advanced Analysis functions such as Major and Minor Phase Analysis, Image Restoration, and TEM Diffraction Patterns are featured, providing the widest variety of analysis possible. HITACHI S9380 II Scanning Electron Microscope is an effective, versatile tool for researchers needing high-precision imaging and analysis in the nanometer-scale range.