Used HITACHI S-9380 II #293821666 for sale

HITACHI S-9380 II scanning electron microscope (SEM) is a modern instrument designed to provide detailed images of samples at high magnification. It uses a thermally-stabilized electron gun to create a high voltage that causes electrons to bombard a sample. The electrons are then focused by a series of magnets and electrostatic lenses, creating a fine beam of electrons that scans the sample in a series of passes. This scanning process creates an image that reveals the surface features of a sample. The sample must be placed in a vacuum so that the electrons are not scattered by air molecules. In addition to imaging the surface features of a sample, HITACHI S9380 II SEM also features omnidirectional EDS (energy-dispersive spectroscopy) that provides an elemental map of a sample, which is useful for identifying the chemical composition of a material. The system is also capable of other analyses such as current imaging, electron backscatter diffraction, and X-ray imaging. S-9380-II SEM is equipped with a high-resolution display monitor, which enhances the resolution of images displayed on it. The system has a maximum magnification of up to 500kx, and can focus down to a minimum of one nanometer. S 9380 II SEM is user-friendly and can be operated by a minimum of technical knowledge. The analytical accessories are simple and easy to set up, and the small size of the instrument makes it easy to move and install in a variety of locations. HITACHI S 9380 II SEM is an important tool for academic research, industrial development, and quality control. It can provide rapid feedback on composition and structural features of samples with high accuracy and precision. The combination of imaging, elemental mapping, and other analyses make HITACHI S-9380-II SEM an invaluable instrument for many of applications.