Used HITACHI S-9380 II #9095786 for sale

HITACHI S-9380 II Scanning Electron Microscope (SEM) is a high-end equipment designed for nanoscience, materials science and semiconductor research applications. It features a broad range of magnification from several millimeters down to galleries, enabling a higher resolution of imaging with superior image quality, featuring a new generation of high-performance microanalysis such as EDX at the nanometer level. The state-of-the-art energy filter is incorporated for efficient semiquantitative elemental analysis, providing definitive advantages for material research in the nano domain. The system is equipped with an enhanced vacuum chamber, with an even greater operating capability, to provide an accurate and stable environment under a wide range of applications. Its rugged construction is designed to last, even under the challenging conditions of high-resolution microscopy operations. HITACHI S9380 II is outfitted with a cold-field emission electron gun (CFE) source, providing a high-brightness electron beam for greater image quality. A highly sensitive digital imaging unit is an important feature of this Scanning Electron Microscope. Its resolution exceeds that of other SEMs in its class, enabling detailed imaging of micro- and nano-structures. Large areas can be scanned quickly and effectively with the fast digital imaging machine. Advanced analytical features such as EDX and EBSD are included for precision mapping and imaging of elemental distributions and crystallographic structure. S-9380-II is also equipped with a wafer holder for greater convenience when loading small samples. A memory tool can store up to 2,000 images, enabling quick recall of previous images, even at low magnifications. An electronic interface feature allows connection to a personal computer, allowing advanced computerized control of the microscope. S9380 II is also designed for user convenience and convenience. A seven-inch LCD display provides a clear view of the images, allowing them to be navigated quickly and easily. An ergonomic design provides easy access to all of S-9380 II's components. A full range of ancillary components including a laser autofocus, automated focused ion beam systems, automated stage, data acquisition, automated stage, and image data processing equipment is available to make complex measurements and operations easier and quicker to perform. With its impressive features and unparalleled performance, HITACHI S 9380 II can provide the most sophisticated, in-depth analysis of materials and structures in nanometer domain. This makes the asset an ideal instrument for nanoscience, materials science and semiconductor research applications. The nanometer-level resolution imaging and analysis capabilities make it the first choice of researchers around the world.