Used HITACHI S-9380 II #9133735 for sale

HITACHI S-9380 II scanning electron microscope is a powerful tool for the examination of materials at magnifying powers of up to 500,000 times. Its secondary electron (SE) and backscattered electron (BSE) detectors provide a resolution of 2-3nm. Its precise sample positioning device also enables parallel-plate focusing to enhance image clarity throughout the operating range. The fully-automated equipment consists of a wide range of functions to suit a variety of needs, including a 21-position sample disk and a motorized stage for sample manipulation. It allows samples to be moved quickly and accurately between widely-spaced positions, avoiding human error. HITACHI S9380 II also offers automated image capture for both the SE and BSE detectors, providing recordable images that can be stored and reviewed later. It also includes advanced features for controlling the electron beam spot size and modulation, as well as an interface for controlling the current, voltage, and scan speed. This ensures a more reliable imaging experience with high-quality results. S-9380-II comes equipped with an edge-enhancement system that uses combining of SE and BSE detectors to improve visual contrast and characterize delicate features on the sample surface. The unit also incorporates a unique measurement machine, including an in-camera centering feature, for advanced sample analysis. The X-Y beam positioning encoders provide for accurate beam placement, ensuring highly-detailed images on the sample. The in-built tilting mechanism helps to apply tilts up to +- 30 degrees with minimal sample drift, which is particularly useful when examining samples of varying density and composition. The self-cleaning remote view unit allows comfortable observation of the sample, minimizing contamination. It also features an Intelligent Purity Tool (IPS) that enables automated analysis of the vacuum environment and automatically adjusts the parameters of the microscope depending on the air quality. For added user flexibility, the asset also supports software applications such as Analyze, EZView, and 3D Image Analysis for 3D analysis of samples. Furthermore, an online service with an engineering team is readily available to assist in maintenance and repairs. Overall, HITACHI S-9380-II scanning electron microscope is a feature-packed tool for precise imaging and analysis of samples. Its advanced automation and comprehensive range of functions make it an ideal choice for countless applications.