Used HITACHI S-9380 II #9197047 for sale

HITACHI S-9380 II
ID: 9197047
Wafer Size: 12"
Vintage: 2007
CD Scanning electron microscope (SEM), 12" (3) TDK Load ports: SEM(B) Work station(FA-PC) 2007 vintage.
HITACHI S-9380 II Scanning Electron Microscope (SEM) is a powerful imaging system that uses a focused electron beam to generate high-resolution images of microstructures, surfaces, and particles at high magnifications. Using a combination of Digital Micrograph Image Processing software and high-sensitivity detectors, HITACHI S9380 II can detect and collect a variety of interesting images and morphological information. S-9380-II is an ultra-high-resolution imaging system with an advanced air-bearing sample stage, allowing for scan speeds of up to 10mm/s. This enables nanometer-level spacing, allowing for high-resolution imaging of even nanometer-scale features. The high-speed scanning also enables S 9380 II to collect images quickly, minimizing the need for long, tedious scanning times. The vacuum chamber of S9380 II also houses a highly sensitive detector, capable of collecting a wide range of image features from microns to nanometers. In addition, HITACHI S 9380 II is equipped with a variety of automated functions, such as automated stage positioning, auto-focus, automated image processing, and automated acquisition of secondary electron (SE) images. These features enable users to quickly and accurately collect images and extract valuable information about the sample. Through the use of Digital Micrograph Image Processing software, S-9380 II can also be used to enhance images, apply automated filtering algorithms, and even measure features with precision down to the nanometer scale. When combined, the advanced imaging capabilities of HITACHI S-9380-II and digital processing capabilities allow users to collect high-resolution images, measure features, and generate statistical data through automated analysis. This makes HITACHI S-9380 II a powerful tool for researchers and industrial users looking to obtain detailed images of small-scale features, and enables them to quickly and accurately analyze samples.
There are no reviews yet