Used HITACHI S-9380 II #9197050 for sale

HITACHI S-9380 II is an advanced scanning electron microscope designed for nanoscale imaging and analysis. It is one of the most powerful scanning electron microscopes available and capable of providing images with a resolution of less than 1 nm, detecting particles as small as 0.3 nanometers in size. It uses a tungsten-targeted Field Emission Cathode (FEC) electron source that produces a high beam intensity, offering high stability and low vibration levels. HITACHI S9380 II is capable of two electron and three electron imaging and can be used to study a broad range of samples, including nanomaterials, semiconductors, ceramics, and biological specimens. With an SE imaging system, S-9380-II can determine the chemical composition of a sample with high accuracy at nanometer levels of resolution. It can also be used to image buried structures, detect elements and compounds, and can analyze the three-dimensional surface topography of a sample with an unprecedented level of detail. Additionally, the unique capability of HITACHI S-9380-II to analyze elemental composition in 3D makes it ideal for analyzing structures down to the atomic level. The microscope is also equipped with a backscattered electron detector which can be used to analyze the sample in topographical context or for elemental composition depth profile analysis. For advanced analytical capabilities, S9380 II is also equipped with an Energy Dispersive X-Ray Spectrometer (EDS) which allows for elemental analysis in the range of 0-99%. The electron source of HITACHI S 9380 II is equipped with two filters, allowing the user to select the appropriate filter for the specific application. Depending on the nature of the sample, a variety of accelerating voltages can be used, ranging from 0.25 to 30 kV. The microscope is also capable of being automated for sample analyses, which makes it easier to collect and analyze data. S 9380 II is a reliable, robust system that can handle a wide variety of samples with precision and accuracy. Above all, S-9380 II offers a very high level of resolution, enabling researchers to obtain highly detailed images and data on an atomic scale. Ultimately, this state-of-the-art scanning electron microscope provides scientists and engineers with a powerful tool to help them gain unprecedented insights into nanostructures and their composition.