Used HITACHI S-9380 II #9236036 for sale
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ID: 9236036
Wafer Size: 12"
Vintage: 2004
Scanning Electron Microscope (SEM), 12"
2004 vintage.
HITACHI S-9380 II is a scanning electron microscope designed for a wide variety of advanced analysis techniques. It is a semi-inverted type, meaning the specimen is placed on the lower side and the electron column is positioned on the top side. This scanning electron microscope includes a field emission gun which emits well focused electron beams and enables high resolution and high sensitivity sample imaging at low accelerating voltage. The device comes equipped with a wide range of analytical and imaging capabilities. For elemental analysis, it features an energy dispersive spectrometer which measures X-rays from the specimens and can be used to obtain information about their chemical composition. Additionally, it allows for automatic multiple-point analysis, which is a great tool for quick surface analysis. Further, HITACHI S9380 II allows for various imaging techniques, such as secondary electrons and back scattered electrons. These can be used to gain insight into the surface topography of a specimen and are invaluable in fields such as material science. S-9380-II also features digital interference utilizing high frequency electromagnetic fields. This allows for the magnification of an image up to 80,000X, while still maintaining a good image quality. This technique aids in the observation of nanoscopic structures and surfaces. Image processing, used to visualize the data acquired by microscopy, is simplified with S 9380 II. It includes multi-window level and brightness processing, time lapse image processing, and a variety of other image processing functions. These allow for the efficient identification and presentation of the image data. Overall, HITACHI S 9380 II is an ideal scanning electron microscope for advanced analytical and imaging techniques. Its many features make it an invaluable tool for a variety of different research areas.
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