Used HITACHI S-9380 II #9241975 for sale

HITACHI S-9380 II is a scanning electron microscope (SEM) used for observation, imaging, and analysis of surface features of a variety of materials. With an accelerating voltage of up to 200kV, the microscopy offers high resolution imaging and can produce images down to 5nm resolution. HITACHI S9380 II is a variable pressure type SEM, including functions of high-vacuum, variable pressure (LVP) and low vacuum (LV). Variable pressure SEM operation provides improved imaging of non-conductive samples due to its unique discharge control in LV and LVP modes and also enhances analysis capabilities for specimen surface characterization. S-9380-II features a dedicated TV camera, Virtual STEM magnifying lens, Multi-spot and multi-column functions. The TV camera offers a choice of three cameras to accommodate the user's requirements. Simultaneous operation of up to two objectives enables fast image acquisition. The virtual STEM magnifying lens with multiple magnifications provides a wide range of sample observation at different magnifications. The multiple spots at any magnification setting are available, which helps to make tomography analysis or large area survey available. Furthermore, the multi-column system, a combination of multiple scan ranges, is available to acquire images in several angular orientations for efficient observation. S9380 II includes a variety of analytical capabilities such as energy dispersive X-ray analysis (EDX) and Cathodoluminescence analysis. EDX, used for elemental composition analysis, can be used in both high and low vacuum modes. It is also equipped with the PASENDI - a chemical imaging system enables 2D distribution of specific elements in the sample. Cathodoluminescence (CL) analysis helps in the analysis of optical emission from the sample when it is excited by a high energy electron beam. Besides EDS and CL, HITACHI S 9380 II can also undergo electron backscatter diffraction (EBSD) and single and double beam analysis. In its standard configuration, S-9380 II ships with the EDAX SIMS 180C, an advanced electron imaging device, and a choice of secondary and backscatter electron detectors. It comes with a wide range of optimised accessories for ease of sample mounting and analysis. In short, HITACHI S-9380-II provides a high performance, reliable and cost-effective scanning electron microscope ideal for a variety of applications in material research, nanotechnology, optoelectronics, and life sciences.