Used HITACHI S-9380 II #9241982 for sale

HITACHI S-9380 II is a scanning electron microscope (SEM) designed to provide users with advanced imaging capabilities that allow them to visualize and analyze complicated sample structures in greater detail. The system is equipped with a high performance, large area Field Emission Source (FES) to ensure the highest resolution imaging while offering a wide range of imaging and analytical techniques for a wide range of applications. It is capable of achieving resolutions down to sub-nanometer scales, greater than 2 nm and has high speed image processing and data acquisition. It is well suited for many imaging applications such as advanced semiconductor failure analysis, metallography, process monitoring, contaminant inspection, and failure analysis. The SEM is equipped with a full range of automated sample and stage control options. This includes a high precision XY stage with low drift, improved accuracy and repeatability features, and an innovative sampling chamber design. Dual-mode sample camera automation provides high-speed focusing and navigations to any position in the chamber, in addition to controlled angular sampling. The control software has intuitive commands and image processing tools that make it easy to use and setup. The SEM is also equipped with advanced detection systems such as X-ray energy dispersive spectroscopy (EDS) and energy-filtered imaging (EFI) to provide sharply detailed images with low noise and enhanced contamination detection capabilities. The specimen holder is designed to accommodate various samples including liquid and vacuum specimens, with multiple holders and options available. It includes an electron beam gun that offers an incident beam angle adjustment, for maximum flexibility in detecting areas of interest. The specimen platform can also be configured for tilt and rotation measurements. In terms of imaging, HITACHI S9380 II is equipped with a high resolution, low noise camera that captures detail down to 0.2 nm. Images can be saved quickly with higher speed data transfer, allowing faster sharing of data between users. The camera also offers an extensive selection of video modes that allow for robust analysis of patterns or image quality. Additionally, S-9380-II system is often used for high-sensitivity elemental analysis with analytical features including automatic spectrum analysis, particle identification, and spectral overlays. Overall, S-9380 II is a powerful scanning electron microscope that offers advanced imaging and analytical capabilities. It provides users with the ability to visualize and analyze complex structures down to sub-nanometer scales. The high precision sample and stage control, intuitive control software, and advanced detection systems provide users with the flexibility and accuracy needed for a range of applications.