Used HITACHI S-9380 II #9244832 for sale
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ID: 9244832
Vintage: 2007
Critical Dimension Scanning Electron Microscope (CD SEM)
2007 vintage.
HITACHI S-9380 II Scanning Electron Microscope is a high-end research tool designed to observe extremely small specimens with extraordinary detail. The instrument utilizes electron beams to create an image of the specimen at nanoscale resolution. Using a vacuum chamber, HITACHI S9380 II is able to scan a broad range of specimens in an airtight environment, free from contaminants like water vapor and even static electricity. Its powerful electron beams help reveal the nanostructure of the specimen, down to the sub-atomic level. S-9380-II uses a unique optical system design called Ever Changing Condenser Objective Lens (ECOL) technology. This allows the microscope to scan the specimen across an infinitely variable range of magnifications in a single shot, minimizing errors due to refocusing and human variability. Moreover, a specially designed detector allows the operators to select which type of signal is used to form the image. This can be electrons, secondary electrons, backscattered electrons, or even x-rays. The scan rate of HITACHI S 9380 II is 10 frames-per-second (fps) in SEM mode and 1 fps in STEM mode. This provides excellent imaging performance, even at the highest magnifications. Additionally, the instrument includes a Robot Arm that controls sample exchange and positioning, meaning that no human intervention is required during imaging. This helps to ensure that sample integrity is preserved and that all images used in research are of the highest quality. In terms of resolution, S-9380 II is capable of scanning down to a resolution of 0.7 nanometers in STEM mode and 0.5 nanometers in SEM mode. This can reveal intricate details of the specimen, from the structure of individual molecules to the organization of cells. Moreover, the instrument includes several bright field and dark field modes that allow operators to examine the specimen from different angles. Overall, HITACHI S-9380 is an advanced Scanning Electron Microscope (SEM) designed for research-grade imaging. Its variable magnification, high resolution, and advanced analysis capabilities allow researchers to visualize and study extremely small specimens with unprecedented detail.
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