Used HITACHI S-9380 II #9251638 for sale

HITACHI S-9380 II is a scanning electron microscope (SEM) used to analyze the surface of a sample atom by atom. It is an advanced electronic microscopy version of the commonly used SEMs with a variety of features designed to facilitate improved image quality and analysis. It is an excellent choice for various surface analysis tasks such as investigations of morphology, porosity, elemental composition, and chemical surface modification. This advanced version of the SEM is capable of obtaining high quality images of samples at high magnifications (up to 400,000×). This can be accomplished through a variety of methods, including secondary electron imaging, imaging of backscattered electrons, and SEM imaging using a range of energy dispersive X-ray detectors. The versatile imaging capabilities of this unit make it invaluable for engineering, biology, and material science applications. In terms of image resolution, HITACHI S9380 II offers excellent performance (an image resolution of up to 0.5nm is achievable). This is made possible through a significant upgrade in the electron optics of the SEM; such as larger field lens, an electron gun with improved brightness, and a newly designed objective lens. Additionally, a dual color gun enables users to observe samples with higher contrast and resolution compared to a single color gun. Additionally, the chamber of S-9380-II is designed to minimize electron beam contamination of the sample being investigated. The automated chamber cleaning features allow for the efficient removal of foreign particles from the chamber before analysis. This ensures better image accuracy and reduces downtime. S-9380 II also includes advanced software packages for sample preparation and image manipulation, making it an ideal choice for research and industrial applications. The live image management tool, Particulate Analyzer, reduces the amount of time needed to analyze and manipulate large sets of data and images. The TEM-SEM co-localization features allow users to utilize both microscopic techniques for a single analysis and to investigate a sample's structure both in three dimensions and in the full spectrum of colors. Overall, HITACHI S 9380 II is an advanced version of the SEM with a range of features designed to facilitate improved image quality and analysis. Its versatile imaging capabilities, excellent image resolution, automated chamber cleaning features, and advanced software packages suit it to a variety of applications in a range of fields.