Used HITACHI S-9380 II #9251643 for sale

HITACHI S-9380 II is an advanced scanning electron microscope (SEM) designed for high-resolution imaging and characterization in materials science, semiconductor failure analysis, and biological applications. HITACHI S9380 II features an advanced electron optical equipment and superior performance with minimal contamination and mechanically stable electron beam and analytical equipments in order to achieve excellent analytical results. S-9380-II utilizes a Schottky field emission source and a quadruple deflector system to provide improved operation performance and improved resolution compared to other SEM systems. The instrument has a large 190mm in-lens Ergonomic X-Y Sample Manipulator and an analysis chamber, equipped with an automated Fine Align and Focus unit, that allow it to work with a wide range of samples. With the optional Autoloader function, users are able to automate specimen positioning. This machine also features a cooled specimen chamber, air lock, and automatic contamination control tool to provide a clean field of view and minimize environmental contamination. S9380 II boasts a high level of performance, including a secondary electron imaging resolution of 0.6nm in air and 0.25nm in vacuum, with its SE detector and 2k x 2k pixels resolution in backscattered electron imaging (BSE). The asset also features four spectrometers, two energy filtered imaging systems (EFI and FIM), and a cathodoluminescence mapping model (CALM). EFI allows for simultaneous imaging and monitoring of emission energy peaks from different elements; FIM allows for electron channeling contrast and composition monitoring; and CALM provides sub-micron resolution mapping of luminescent image of a sample. The instrument also has an automated operation control equipment, including an automated alignment system, an alignment assessment unit, and an automated stage navigation machine. This ensures accurate and repeatable operation, allowing users to more precisely control the sample position and accelerating the scanning process. Furthermore, S 9380 II is outfitted with an intuitive interface that provides access to microscope parameters, monitor specimen levels, and issue remote commands. In conclusion, HITACHI S-9380-II is a scanning electron microscope capable of providing superior imaging and characterization performance. It features advanced electron optical components, ergonomic sample manipulation, a wide range of analysis functions, and an automated operation control tool that ensures a smooth scanning process.