Used HITACHI S-9380 II #9251770 for sale
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ID: 9251770
Scanning Electron Microscope (SEM)
Missing parts:
Laser head
PC
HV Controller
Hard Disk Drive (HDD).
HITACHI S-9380 II is a scanning electron microscope (SEM) that can be used for both research and industrial applications. It offers a high resolution of 1.0 nm in conventional mode and 0.5 nm in high resolution mode. It has a high voltage of 30 kV to allow for high magnitude imaging, and can operate in a wide range of temperatures from -50°C to 50°C, making it suitable for a variety of materials. HITACHI S9380 II offers several advantages that make it a powerful tool. The equipment comes with energy filters to provide high contrast imaging of a variety of surfaces, including those with topographic features. The optics module features an infinite-conjugate focusing system, providing an additional level of precision, while the sample stage can hold objects up to 60 kg and can be moved in three different dimensions with precision up to 0.5 μm. In terms of user-friendliness, S-9380-II also offers excellent control, with a joystick that can be intuitively used to navigate the imaging and data analysis tools. Additionally, the microscope can be used with a wide range of detectors to capture images of varying contrast, including secondary electrons, back-scattered electrons, auger electrons, and more. This allows for a range of experiments for different types of samples, in combination with features such as particle analysis and 3D elemental composition mapping. HITACHI S-9380-II is also equipped with an easy-to-use beam control unit. It provides fine beam tuning, an ideal focus that can be adjusted at any magnification, and a vacuum shutter for fast preparation of the samples. In addition, the machine includes computer control and integration to allow for the seamless transition between imaging modes and analysis. Overall, S9380 II is a powerful SEM tool that can significantly maximize workflow efficiency while providing excellent image quality in a variety of conditions. With advanced features such as particle analysis and 3D elemental composition mapping, it is an ideal choice for research and industrial applications.
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