Used HITACHI S-9380 II #9251771 for sale

HITACHI S-9380 II is a scanning electron microscope (SEM) designed for use in a variety of materials analysis applications. Its features include a high-resolution, high-powered image with a range of analytical capabilities. HITACHI S9380 II utilizes a thermionic field emission gun (FEG) to emit a beam of high energy electrons. This allows for the collection of higher resolution images compared to those from traditional SEMs. It also features a secondary electron and backscattered electron detector, enabling users to make a variety of elemental and compositional analysis on specimens. The microscope incorporates a unique "insight 3D" feature that allows users to scan specimens in three dimensions. This allows for the direct measurement of relative heights, topography, and surface electromechanical properties down to the nanoscale. S-9380-II also includes automated software which allows for a range of advanced imaging functions. These include: image stitching, line profile analysis, and 3D image reconstruction. On the mechanical side, HITACHI S 9380 II features a large chamber with a high-vacuum design that utilizes a system of pumps and valves. This allows for stable operation and fast specimen capture and imaging. Additionally, the microscope's stage can cope with temperatures from -20°C to +200°C, allowing for a wide range of sample preparation methods. S 9380 II features a powerful yet user-friendly "Focus Beam Control System," which allows users to accurately focus the microscope's beam onto the specimen. The easy to use touch panel display and user-configurable workflows make the machine ideal for both beginners and experienced microscopists. In conclusion, HITACHI S-9380-II is a high-powered and user-friendly scanning electron microscope that offers a wide range of advanced imaging and analytical features. Its features make it an ideal tool for researchers looking to explore and analyze materials down to the nanoscale.